@inproceedings{zhou2020exploring,
  title={Exploring faster RCNN for fabric defect detection},
  author={Zhou, Hao and Jang, Byunghyun and Chen, Yixin and Troendle, David},
  booktitle={2020 Third International Conference on Artificial Intelligence for Industries (AI4I)},
  pages={52--55},
  year={2020},
  organization={IEEE},
}